Probe System - メーカー・企業9社の製品一覧とランキング

更新日：Dec 03, 2025 集計期間:Nov 05, 2025～Dec 02, 2025
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Probe Systemのメーカー・企業ランキング

更新日：Dec 03, 2025 集計期間:Nov 05, 2025～Dec 02, 2025
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浜松貿易 Shizuoka//Trading company/Wholesale
TAKAYA Corporation Okayama//Industrial Electrical Equipment
阪和トレーディング Osaka//Industrial Machinery
4 Toki Commercial Co., Ltd. Tokyo//Trading company/Wholesale
5 ベクターセミコン Tokyo//Electronic Components and Semiconductors

企業ランキングへ

Probe Systemの製品ランキング

更新日：Dec 03, 2025 集計期間:Nov 05, 2025～Dec 02, 2025
※当サイトの各ページの閲覧回数を元に算出したランキングです。

Multi-Probe System (Dedicated Option for APT-2600FD) TAKAYA Corporation
Automation of 3D measurement probes by robots 浜松貿易
Hands-free probe system 早坂理工
4 [Rental] DC/AC Current Probe System 横河レンタ・リース
4 E-Field Probe System EFS-105 ウェーブクレスト

Probe Systemの製品一覧

1～15 件を表示／全 17 件

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[Rental] DC/AC Current Probe System

A classic for current waveform analysis in switching circuits and more! Introducing a highly versatile current probe system.

At Yokogawa Rental & Lease, we offer the Tektronix 'DC/AC Current Probe System' consisting of four types of current probes and two types of amplifiers. All probes can be used from direct current, and there is no phase shift at low frequencies. The most sensitive probe, the "TCP302A," has a conversion sensitivity of 1mV/mA, allowing for high-sensitivity current measurements of 1mA/div with an oscilloscope voltage sensitivity of 1mV/div. 【Features】 ■ Composed of four types of current probes and two types of amplifiers ■ All probes can be used from direct current ■ No phase shift at low frequencies ■ Can be directly combined with many measuring instruments *For more details, please refer to the PDF document or feel free to contact us.

企業：横河レンタ・リース
価格：Other

Rental/lease
power supply

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E-Field Probe System EFS-105

It is now possible to accurately measure noise in semiconductors, high-density printed circuit boards, components, and modules, which have had many challenges in measurement methods until now.

Features: ★ 1D E-field probe ★ Ultra-small probe head ★ Fiber optic connection ★ Optical power supply – no battery required ★ Wide bandwidth: 500KHz to 3GHz ★ Dynamic range: typ. 130dB (1Hz) ★ Low noise: typ. <10μV/(m×√Hz) @ 200 to 500MHz typ. <30μV/(m×√Hz) @ 5MHz to 3GHz

企業：ウェーブクレスト
価格：Other

EMC Testing
Environmental Test Equipment
Other environmental analysis equipment

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200mm Manual Probe System 'WL-170-THZ'

Signatone's probe systems offer high reliability recognized by the industry, suitable for various measurement applications.

We offer the Signatone 200mm manual probe system 'WL-170-THZ' equipped with a "large area positioner" on a widely enhanced platen. It is capable of RF/mmW, DC, IV-CV, and high power test measurements. It supports various differential/broadband frequency extenders and automatic impedance tuners. With robust design and seamless integration of extenders/tuners, it can accommodate a variety of measurement applications for multi-use. The system features easy operation, allowing quick movements and fine adjustments with a one-handed XY stage knob. Additionally, the quick platen lift enables separation adjustment and micro-rotation locking of the chuck. Options include equipment racks, vibration isolation tables, and thermal chucks. Please feel free to consult us if you have any requests. *For more details, please download the PDF or feel free to contact us.

企業：Toki Commercial Co., Ltd.
価格：Other

Other microscopes

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Introduction to the Manual Probe System Products

A manual probe system that combines high rigidity, high precision, and excellent operability.

The "Manual Probe System" is a system specialized for on-wafer measurements that can be used in various applications such as IV/CV measurements, RF measurements, power device measurements, and reliability testing. We introduce a range of products that combine high rigidity, high precision, and excellent operability. From DC/CV to RF measurement applications for chip sizes up to 2-inch wafers, we offer a rich lineup including the cost-effective "TS50" as well as "TS150-HP/TS200-HP." 【Product List】 ■TS50 ■TS150/TS200/TS300 ■TS150-THZ/TS200-THZ ■TS200-SE/TS300-SE ■TS150-HP/TS200-HP *For more details, please refer to the PDF materials or feel free to contact us.

企業：ベクターセミコン
価格：Other

Other measurement, recording and measuring instruments

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200mm Manual Probe System 'WL-170'

Supports various on-wafer analysis measurement applications, Signatone probe system.

The "WL-170" is a 200mm manual probe system that performs accurate RF, DC, IV-CV, and high-power test measurements with high reliability. It can be configured in multiple ways with chuck options, micro-positioners for DC/RF/high power, microscopes, cameras, PCB holders, and more. Additionally, optional items such as equipment racks, vibration isolation tables, and thermal chucks are also available. *For more details, please download the PDF or feel free to contact us.

企業：阪和トレーディング
価格：Other

probe

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150mm-200mm Manual Probe System 'WL-1160'

High reliability and accurate RF/mmW, DC, IV-CV, high power test measurements Signatone probe system.

We offer the manual probe system 'WL-1160' equipped with a steel platen compatible with magnetic or vacuum suction, or fixed RF/DC/HP positioners, with a range of 150mm-200mm. With a robust design and multiple setup and configuration options, it can accommodate various applications. It can be used for a wide range of RF/DC/HP testing. Additionally, quick movement and fine adjustments are possible with the XY stage knob that can be operated with one hand. 【Example Configuration】 - Quick platen lift for platen separation adjustment, chuck micro-rotation, and locking - Multiple configurations available with chuck options, DC/RF/1-10KV micro-positioners, microscopes, cameras, PCB holders, etc. - Instrument racks, vibration isolation tables, thermal chucks, dark boxes, etc., are also available (optional). *For more details, please download the PDF or feel free to contact us.

企業：阪和トレーディング
価格：Other

probe

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Multi-Probe System (Dedicated Option for APT-2600FD)

Programming for FPGAs and special performance tests such as BST can be handled with a flying probe tester.

This is an option that equips the underside operating axis of the APT-1600FD series with a dedicated fixture lifting mechanism. It allows for special inspections connected to external devices, such as Boundary Scan Tests (BST), as well as writing to and reading logs from ICs, to be performed in parallel with in-circuit testing. *For an image of the operation, please refer to the YouTube video.

企業：TAKAYA Corporation
価格：Other

Circuit Board Inspection Equipment

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150mm-200mm Manual Probe System 'WL-1160'

Signatone's probe system for accurate RF/mmW, DC, IV-CV, and high-power testing with high reliability.

We offer the manual probe system 'WL-1160' equipped with a steel platen compatible with magnetic or vacuum suction, or fixed RF/DC/HP positioners, with a range of 150mm-200mm. With a robust design and multiple setup and configuration options, it can accommodate various applications. It is suitable for a wide range of RF/DC/HP testing. Additionally, it features a one-handed operable XY stage knob for quick movements and fine adjustments. 【Example Configuration】 - Quick platen lift for platen separation adjustment, chuck micro-rotation, and locking - Multiple configurations available with chuck options, DC/RF/1-10KV micro-positioners, microscopes, cameras, PCB holders, etc. - Instrument racks, vibration isolation tables, thermal chucks, dark boxes, etc., are also available (optional). *For more details, please download the PDF or feel free to contact us.

企業：Toki Commercial Co., Ltd.
価格：Other

Other microscopes

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200mm High Precision Manual Probe System 'WL-210-LE'

Signatone probe system with local enclosure for accurate measurement.

We offer the high-reliability 200mm high-precision manual probe system 'WL-210-LE' with a local enclosure. It supports various applications such as failure analysis (FA), RF and mmW wafer-level reliability, and device characterization. The local enclosure is a high-performance environmental chamber that provides excellent EMI shielding and a light-tight environment, in addition to low noise and superior measurement of low capacitance. 【Features (e.g., Local Enclosure)】 ■ Advanced EMI/RFI/light shielding ■ Low leakage measurement (femtoamperes) ■ Operating temperature: -60°C to +300°C *For more details, please download the PDF or feel free to contact us.

企業：Toki Commercial Co., Ltd.
価格：Other

Other microscopes

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Introduction to the Semi-Automatic Probe System Products

Innovative semi-automatic probe system that meets various measurement needs.

The "Semi-Auto Probe System" is a system that establishes an accurate and stable automatic measurement environment through excellent mechanical precision and high reproducibility, as well as advanced operation software SENTIO. We introduce a range of products that cater to various measurement applications and needs. Starting with the "TS2000/TS2000-D," which supports wafers up to 8 inches, we have a rich lineup including "TS2000-SE" and "TS3000-SE." [Product List] ■TS2000/TS2000-D ■TS2000-SE ■TS2000-HP ■TS3000 ■TS3000-SE *For more details, please refer to the PDF materials or feel free to contact us.

企業：ベクターセミコン
価格：Other

Other measurement, recording and measuring instruments

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Hands-free probe system

Efficient hands-free measurement operations every day! Introducing our product lineup.

The "hands-free probe system" is a tool that enables stable work without hands. It features a powerful magnet and a stainless steel base plate, making it easy to move and secure fixtures and probes. We offer the hands-free probe "SQ series," compatible with oscilloscopes with automatic scaling (10:1), as well as the "PCBite SQG series," which can be used with many measuring instruments that have a 50Ω input impedance. [Product Lineup] ■ Hands-free Probe SQ Series ■ PCBite SQG Series High-Frequency Probes *For more details, please download the PDF or feel free to contact us.

企業：早坂理工
価格：Other

probe

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Valprobe System

Introducing a highly accurate and reliable offline validation system!

The "Balprobes System" is an offline process validation and monitoring system. It consists of three components: a data logger, a reader, and system software. It goes beyond mere data collection to enable data analysis and the creation of validation reports compliant with Part 11. 【Features】 ■ Offline system ■ Composed of a data logger, reader, and system software ■ Capable of data analysis and creating validation reports compliant with Part 11 *For more details, please refer to the PDF materials or feel free to contact us.

企業：エナ
価格：Other

Other Data Loggers
Other Software

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200mm Manual Probe System 'WL-170-THZ'

Signatone's probe system, recognized by the industry for its high reliability, supports various measurement applications.

We offer the Signatone 200mm manual probe system 'WL-170-THZ' equipped with a "large area positioner" on a widely reinforced platen. It is capable of RF/mmW, DC, IV-CV, and high power test measurements. It supports a variety of differential/broadband frequency extenders and automatic impedance tuners. With robust design and seamless integration of extenders/tuners, it can accommodate various measurement applications, making it versatile for multiple uses. The system features easy operation, allowing for quick movements and fine adjustments with a one-handed XY stage knob. Additionally, the quick platen lift enables separation adjustment, chuck micro-rotation, and locking of the platen. Options include equipment racks, vibration isolation tables, and thermal chucks. Please feel free to consult us if you have any requests. *For more details, please download the PDF or feel free to contact us.

企業：阪和トレーディング
価格：Other

probe

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200mm High Precision Manual Probe System 'WL-210-LE'

Probe system by Signatone with local enclosure for accurate measurement.

We offer the high-reliability 200mm high-precision manual probe system 'WL-210-LE' with a local enclosure. It supports various applications such as failure analysis (FA), RF and mmW wafer-level reliability, and device characterization. The local enclosure is a high-performance environmental chamber that provides excellent EMI shielding and a light-tight environment, in addition to low noise, making it ideal for low capacitance measurements. 【Features (e.g., Local Enclosure)】 ■ Advanced EMI/RFI/light shielding ■ Low leakage measurements (femtoamperes) ■ Operating temperature: -60°C to +300°C *For more details, please download the PDF or feel free to contact us.

企業：阪和トレーディング
価格：Other

probe

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Automation of 3D measurement probes by robots

By equipping a Keyence handheld probe on a robot, it is possible to automate manual tasks, facilitate data exchange, create jigs, and perform setup.

We will automate the measurement of shapes such as board thickness, hole diameter, step differences, and gaps. Comparison with CAD data is also possible. We provide support as a SIr, including the design and production of jigs and clamps for measurement, as well as teaching. By automating and digitizing manual measurements using calipers and inspection tools, we contribute to our customers' digital transformation (DX). When acquiring and measuring 3D data, we can choose various methods and equipment based on factors such as the size, shape, tolerance, surface condition, and cycle time of the workpiece being measured. Each method has its advantages and disadvantages, but our product can measure with higher precision than non-contact methods without human intervention. It is also advantageous that a system can be built not only in measurement rooms but also in manufacturing process sites, and the cost is kept lower compared to other systems. It is expected to be used in many fields such as automotive, motorcycle, home appliance parts, aerospace parts, and industrial equipment parts.

企業：浜松貿易
価格：Other

3D measuring device
Visual Inspection Equipment

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